Focused ion beam ( FIB ) is very useful in failure analysis and chip repairing. A FIB machine directs a controlled stream of ions toward a semiconductor chip and is capable of changing the molecular structure of the chip. Since ions are extremely small, they can be used very effectively in micro-machining applications with silicon chips. If you want to revise metal layers of chip , you may use FIB technology. And PGC will provide this service for customer.