Solution

ASIC Implementation Platform Service

CUSTOMER RFQ

Business Model

ASIC Turnkey Service

ASIC Technology:

12″(nm):

3nm, 5nm, 6nm, 7nm, 12nm, 16nm, 22nm, 28nm, 40nm,
55nm, 65nm, 90nm, 110nm, 130nm, Other

8″(um):

0.11um, 0.13um, 0.15um, 0.18um, 0.25um, 0.35um,
0.5um, Others

ASIC Implementation Platform Service

Spec-in, FPGA-in, RTL(Verilog, VHDL)-in, Netlist-in, GDSII-in, IP Merge, Tape-out, IR Drop, Synthesis, STA, Signal Integrity, APR Layout, Low Power Design, Power Domain, Clock Domain, DFT, ATPG, JTAG, BSD, Mem_BIST, IP_BIST, IBIS, LVS, DRC, Verification, Memory ECC, Memory Repair, PPA(Power, Performance, Area)

MPW / CyberShuttle Service

CoWoS Turnkey Service

Gate Array Turnkey Service

FPGA To ASIC Turnkey Service

Embedded Flash Turnkey Service

High Voltage Turnkey Service

SoC Platform Turnkey Service

ARM-based Platform;Andes-based Platform, Others

IP (Special I/O, High Speed Interface I/O, Mixed Signal, High Density Memory, Flash...) Design Service

PLL, Special I/O, High Speed Interface I/O, ADC & DAC, High Density Memory;Customized IP, Modify, CPU Hardening

APR Layout Service (ICC2)

COT / Foundry Turnkey Service

SiP(System-in-Package) / 3D Package Turnkey Service

ASIC Product Turnkey Service (PGC + TSMC + ASE)

Testing Program Development(Credence D10, Chroma 3650, Ytec S1007D, Others), Logistic, WIP, CP, FT, MP, Package, Testing, Yield Improvement, Corner Run, RMA, Failure Analysis, Reliability, Wafer Allocation, Hot Run, Super Hot Run, Special Run

ASIC Service Overview

Integration

Implementation

Mass Production

PGC Ecosystem Partners

APR(ICC2) Development Platform(TSMC 3nm & CoWoS)

APR(ICC2) Development
Platform(TSMC 3nm & CoWoS)

EDA Tool Installation

Synopsys (ICC2) APR Design Flow for TSMC 3nm

Synopsys (ICC2) APR
Design Flow for TSMC 3nm

TSMC Recommend IP Alliance Program,
Synopsys IP OEM Program,

More and More Customized IP

CPU IP

ARM, ANDES, Others

Digital IP

ARM, ANDES, Cortex, WDC, UART, JPEG, H.264, 10/100/1000 MAC, USB2.0/ 3.0/3.1 Controller, DDR2/3/4, 8051, 6502, 16-bit MCU, 32-bit MCU, Others

Mixed Signal IP

ADC, DAC, Codec, PLL, Crystal Oscillator, LDO, POR, Bandgap, Voltage Regulator, Others

High Speed Interface PHY

USB2.0/3.0/3.1, DDR2/3/4, SATAI/II/III, PCIe, HDMI, XAUI, MIPI, SerDes, Others

Special I/O IP

I2C, 1394a IO, LVDS, PECL, SSTL-2, SSTL-18, SSTL-15, USB2.0/3.0/3.1 HSTC, PCI-X, 32K Crystal Oscillator, Others

Memory IP

SRAM, ROM, Flash, OTP, MTP, FUSE, EEPROM, Others

Analog IP

LDO, Buck/Boost PWM converter, PFC(Mixed/HV/BCD), Others

Customized IP X PGC IP

Clocking

PLL, DLL, OSC, De-skew, Others

ADC

Pipelined, SAR, Cyclic, Delta-sigma, Single-slope, Others

DAC

Current-mode, Voltage-mode, Others

AFE

PGA, Filter, CDS, Others

Others

LDO, LVDS, POR, VDT, Data Converter, Special I/O, High Speed Interface
I/O, SerDes, Others

TSMC IP

※ Over 1000 successful ASIC design projects tape out at TSMC(1991 – 2024)

Major IP

TSMC Embedded Flash

IP Partners

Mentor

Kilopass

Snowbush

MIPS

COSMIC

PLDA

AnaFocus

FSA

COT/Foundry Turnkey Service

Turnkey Testing Solution & Service

Turnkey Testing Solution
& ServiceFlash

Test Engineering Capabilities

Test Program Development

Digital (Function/DFT-ATPG-MBIST-JTAG), Mixed-signal (ADC/DAC…),Emb-memory (Flash/OTP), High-speed interface (USB/PCIe/LVDS/DDR…),High-voltage, Pattern conversion, Multi-tester platform

Test Fixtures Development

Socket, Probe Card, Load Board, Handle Change Kits, Tri-temperature

Production Support

Device characterization, Engineering data analysis, Failure analysis, Test time reduction, Yield improvement, Multi-site maximize throughput, Capacities expansion

Test Program Development Flow

Test Program
Development Flow

Tester Platform

Cost-Effective, Popular & Easy expansion of production capacity

Credence D10, Chroma 3650 series, Ytec S1007D

Digital Capability

Test speed 100/200MHz, Pattern size 16M, Scan / Emb-memory test

Mixed-signal / Analog Capability

AWG: 24-bit High-Precision or 16-bit high-speed (max 250MS/s)
Digitizer: 24-bit High-Resolution or 16-bit High-Speed (max 130MS/s)

Hi-Voltage Capability

±20V / ±45V / ±60V / ±150V

Reliability Test

Failure Analysis

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