Solution

DFT/ATPG Service

SoC DFT and ATPG SERVICE FLOW

SoC DFT and ATPG
SERVICE FLOW

Boundary Scan Service Flow

Boundary Scan
Service Flow

Memory BIST Service Flow

Memory BIST
Service Flow

FIB Overview

Focused ion beam ( FIB ) is very useful in failure analysis and chip repairing. A FIB machine directs a controlled stream of ions toward a semiconductor chip and is capable of changing the molecular structure of the chip. Since ions are extremely small, they can be used very effectively in micro-machining applications with silicon chips. If you want to revise metal layers of chip, you may use FIB technology. And PGC will provide this service for customer.

FIB Flow

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