Solution
DFT/ATPG Service
![](https://www.pgc.com.tw/wordpress/wp-content/uploads/2023/10/PGC_title_icon.png)
FIB Overview
Focused ion beam ( FIB ) is very useful in failure analysis and chip repairing. A FIB machine directs a controlled stream of ions toward a semiconductor chip and is capable of changing the molecular structure of the chip. Since ions are extremely small, they can be used very effectively in micro-machining applications with silicon chips. If you want to revise metal layers of chip, you may use FIB technology. And PGC will provide this service for customer.