Solution
ASIC Product Turnkey Service(PGC+TSMC+ASE)
COT/Foundry Turnkey Service
Turnkey Testing Solution & Service
Turnkey Testing Solution
& ServiceFlash
- Major testers include Credence D10, Chroma 3650, Ytec S1007D, Others.
- Test Program / Fixture Development / CP / FT / MP
- Support Industrial Grade, Automotive Grade(Grade 0~3)
- Testing Temp. Ability: - 55°C ~ 150°C
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Test Engineering Support
Device Characterization; Failure Analysis
Test Time Reduction; Yield Improvement
Test Engineering Capabilities
Test Program Development
Digital (Function/DFT-ATPG-MBIST-JTAG), Mixed-signal (ADC/DAC…),Emb-memory (Flash/OTP), High-speed interface (USB/PCIe/LVDS/DDR…),High-voltage, Pattern conversion, Multi-tester platform
Test Fixtures Development
Socket, Probe Card, Load Board, Handle Change Kits, Tri-temperature
Production Support
Device characterization, Engineering data analysis, Failure analysis, Test time reduction, Yield improvement, Multi-site maximize throughput, Capacities expansion
Test Program Development Flow
Test Program
Development Flow
Tester Platform
Cost-Effective, Popular & Easy expansion of production capacity
Digital Capability
Credence D10, Chroma 3650 series, Ytec S1007D
Test speed 100/200MHz, Pattern size 16M, Scan / Emb-memory test
Mixed-signal / Analog Capability
AWG: 24-bit High-Precision or 16-bit high-speed (max 250MS/s)
Digitizer: 24-bit High-Resolution or 16-bit High-Speed (max 130MS/s)
Hi-Voltage Capability
±20V / ±45V / ±60V / ±150V
Reliability Test
Failure Analysis
Mass Production Control Flow
Mass Production Control Flow
Test Cost Reduction
DC/AC Scan Compression
Tradition Scan
Adaptive Scan
- Above tradition scan chain have longer scan chain length (2000 flops)
- Adaptive scan chains are split into shorter chain length (200 flops)
- Shorter chains require less time to load and less data to be loaded on tester and significant save test cost