Solution
DFT/ATPG Service
SoC DFT and ATPG SERVICE FLOW
SoC DFT and ATPG
SERVICE FLOW
Boundary Scan Service Flow
Boundary Scan
Service Flow
Memory BIST Service Flow
Memory BIST
Service Flow
FIB Overview
Focused ion beam ( FIB ) is very useful in failure analysis and chip repairing. A FIB machine directs a controlled stream of ions toward a semiconductor chip and is capable of changing the molecular structure of the chip. Since ions are extremely small, they can be used very effectively in micro-machining applications with silicon chips. If you want to revise metal layers of chip, you may use FIB technology. And PGC will provide this service for customer.
FIB Flow
